Articles | Volume 12, issue 2
https://doi.org/10.5194/jsss-12-225-2023
https://doi.org/10.5194/jsss-12-225-2023
Regular research article
 | 
25 Aug 2023
Regular research article |  | 25 Aug 2023

Analysis of thermal-offset drift of a high-resolution current probe using a planar Hall resistance sensor

NamYoung Lee, Jaesoo Kim, and DaeSung Lee

Viewed

Total article views: 447 (including HTML, PDF, and XML)
HTML PDF XML Total BibTeX EndNote
309 112 26 447 16 13
  • HTML: 309
  • PDF: 112
  • XML: 26
  • Total: 447
  • BibTeX: 16
  • EndNote: 13
Views and downloads (calculated since 25 Aug 2023)
Cumulative views and downloads (calculated since 25 Aug 2023)

Viewed (geographical distribution)

Total article views: 419 (including HTML, PDF, and XML) Thereof 419 with geography defined and 0 with unknown origin.
Country # Views %
  • 1
1
 
 
 
 
Latest update: 02 Jul 2024
Download
Short summary
Because most commercialized current sensors can only measure current flow when a signal line is inserted into a clamp-shaped probe, it is impossible to measure the current waveform of a high-end PCB with a sub-millimeter fine pitch. We developed a pin-type current probe with high sensitivity, targeting the analysis of high-end PCBs. The probe can measure the current waveform by simply contacting the measurement point. This paper reports on the current sensor development.