Articles | Volume 12, issue 2
https://doi.org/10.5194/jsss-12-225-2023
https://doi.org/10.5194/jsss-12-225-2023
Regular research article
 | 
25 Aug 2023
Regular research article |  | 25 Aug 2023

Analysis of thermal-offset drift of a high-resolution current probe using a planar Hall resistance sensor

NamYoung Lee, Jaesoo Kim, and DaeSung Lee

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Short summary
Because most commercialized current sensors can only measure current flow when a signal line is inserted into a clamp-shaped probe, it is impossible to measure the current waveform of a high-end PCB with a sub-millimeter fine pitch. We developed a pin-type current probe with high sensitivity, targeting the analysis of high-end PCBs. The probe can measure the current waveform by simply contacting the measurement point. This paper reports on the current sensor development.
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