Articles | Volume 6, issue 1
https://doi.org/10.5194/jsss-6-163-2017
https://doi.org/10.5194/jsss-6-163-2017
Regular research article
 | 
02 May 2017
Regular research article |  | 02 May 2017

H2S dosimeter with controllable percolation threshold based on semi-conducting copper oxide thin films

Christoph Seitz, Giuliana Beck, Jörg Hennemann, Christian Kandzia, Karl P. Hering, Angelika Polity, Peter J. Klar, Andrej Paul, Thorsten Wagner, Stefanie Russ, and Bernd M. Smarsly

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