Journal of Sensors and Sensor Systems
Journal of Sensors and Sensor Systems
JSSS
Articles | Volume 10, issue 2
Articles | Volume 10, issue 2
https://doi.org/10.5194/jsss-10-171-2021
© Author(s) 2021. This work is distributed under
the Creative Commons Attribution 4.0 License.
Special issue:
https://doi.org/10.5194/jsss-10-171-2021
© Author(s) 2021. This work is distributed under
the Creative Commons Attribution 4.0 License.
Articles | Volume 10, issue 2
Regular research article
 | 
15 Jul 2021
Regular research article |  | 15 Jul 2021

Investigation of a metrological atomic force microscope system with a combined cantilever position, bending and torsion detection system

Yiting Wu, Elisa Wirthmann, Ute Klöpzig, and Tino Hausotte

Viewed

Total article views: 1,447 (including HTML, PDF, and XML)
HTML PDF XML Total BibTeX EndNote
1,004 347 96 1,447 100 164
  • HTML: 1,004
  • PDF: 347
  • XML: 96
  • Total: 1,447
  • BibTeX: 100
  • EndNote: 164
Views and downloads (calculated since 15 Jul 2021)
Cumulative views and downloads (calculated since 15 Jul 2021)

Viewed (geographical distribution)

Total article views: 1,372 (including HTML, PDF, and XML) Thereof 1,372 with geography defined and 0 with unknown origin.
Country # Views %
  • 1
1
 
 
 
 
Latest update: 18 Mar 2026
Download
Short summary
A new metrological atomic force microscope (MAFM) head design is shown. We investigated the MAFM head in the nanomeasuring machine (NMM-1) for different high-precision and large-scale traceable measurement tasks. Due to their integration, the MAFM head can benefit from the large measuring range, high-precision and traceability of the NMM-1 for efficient measurements on different samples. The presented results show the realised macroscale measurements with sub-nanometre resolution.
Read more
Share
Special issue
Sensors and Measurement Science International SMSI 2020