Articles | Volume 12, issue 1
https://doi.org/10.5194/jsss-12-1-2023
https://doi.org/10.5194/jsss-12-1-2023
Regular research article
 | 
12 Jan 2023
Regular research article |  | 12 Jan 2023

Simulation-based investigation of the metrological interface structural resolution capability of X-ray computed tomography scanners

Matthias Busch and Tino Hausotte

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Latest update: 22 Nov 2024
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Short summary
The paper presents a specimen and evaluation method for interface structural resolution testing of X-ray computed tomography systems based on CT simulations. The geometry is oriented to the norms of image quality investigation. The evaluation is based on profile lines of the cross-sectional images that pass through the boreholes. All statements on resolution refer to the entire measurement chain and, thus, in addition to the reconstruction algorithm also to the surface determination method used.