Articles | Volume 12, issue 1
https://doi.org/10.5194/jsss-12-1-2023
https://doi.org/10.5194/jsss-12-1-2023
Regular research article
 | 
12 Jan 2023
Regular research article |  | 12 Jan 2023

Simulation-based investigation of the metrological interface structural resolution capability of X-ray computed tomography scanners

Matthias Busch and Tino Hausotte

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Cited articles

Arenhart, F. A., Nardelli, V. C., and Donatelli, G. D.: Characterization of the metrological structural resolution of CT systems using a multi-wave standard, Proc. XXI IMEKO World Congress, 30 August–4 September 2015, Prague, Czech Republic, https://www.imeko.org/publications/wc-2015/IMEKO-WC-2015-TC14-282.pdf (last access: 23 December 2022), 2015. 
aRTist: Bundesanstalt für Materialforschung und -prüfung (BAM), Berlin, Germany, https://artist.bam.de/, last access: 23 December 2022. 
Bartscher, M., Neuschaefer-Rube, U., Illemann, J., Borges de Oliveira, F., Stolfi, A., and Carmignato, S.: Qualification and Testing of CT Systems, in: Industrial X-Ray Computed Tomography, edited by: Carmignato, S., Dewulf, W., and Leach, R., Springer, Cham, https://doi.org/10.1007/978-3-319-59573-3_6, 2018. 
Binder, F. and Hausotte, T.: About the distinction of resolution concepts in industrial computed tomography, tm-Tech. Mess., 89, 20–24, https://doi.org/10.1515/teme-2022-0065, 2022. 
Busch, M. and Hausotte, T.: Determination of the Interface Structural Resolution of an Industrial X-Ray Computed Tomograph using a Spherical Specimen and a Gap Specimen Consisting of Gauge Blocks, Key Engineering Materials, vol. 883, Trans Tech Publications, 41–48, https://doi.org/10.4028/www.scientific.net/KEM.883.41, 2021. 
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Short summary
The paper presents a specimen and evaluation method for interface structural resolution testing of X-ray computed tomography systems based on CT simulations. The geometry is oriented to the norms of image quality investigation. The evaluation is based on profile lines of the cross-sectional images that pass through the boreholes. All statements on resolution refer to the entire measurement chain and, thus, in addition to the reconstruction algorithm also to the surface determination method used.