Articles | Volume 13, issue 1
https://doi.org/10.5194/jsss-13-89-2024
© Author(s) 2024. This work is distributed under
the Creative Commons Attribution 4.0 License.Special issue:
Concept for improving the form measurement results of aspheres and freeform surfaces in a tilted-wave interferometer
Related authors
Related subject area
Applications: Production measurement technology
Enabling the use of digital calibration certificates in industrial calibration management systems
Characterization of sand and sand–binder systems from the foundry industry with electrical impedance spectroscopy
Model-based analysis of constructional steel structures exemplified by dimensional checking on railway car shells using 3D scanning
HoloPort – design and integration of a digital holographic 3-D sensor in machine tools
Precise linear measurements using a calibrated reference workpiece without temperature measurements
J. Sens. Sens. Syst., 13, 71–79,
2024J. Sens. Sens. Syst., 10, 43–51,
2021J. Sens. Sens. Syst., 9, 109–116,
2020J. Sens. Sens. Syst., 9, 33–41,
2020J. Sens. Sens. Syst., 7, 609–620,
2018Cited articles
Baer, G., Schindler, J., Pruss, C., Siepmann, J., and Osten, W.: Calibration of a non-null test interferometer for the measurement of aspheres and free-form surfaces, Opt. Express, 22, 31200, https://doi.org/10.1364/OE.22.031200, 2014. a
Beutler, A.: Metrology for the production process of aspheric lenses, Advanced Optical Technologies, 5, 211–218, https://doi.org/10.1515/aot-2016-0011, 2016. a
Chim, S. S. C. and Kino, G. S.: Phase measurements using the Mirau correlation microscope, Appl. Opt., 30, 2197, https://doi.org/10.1364/AO.30.002197, 1991. a
Chim, S. S. C. and Kino, G. S.: Three-dimensional image realization in interference microscopy, Appl. Opt., 31, 2550, https://doi.org/10.1364/AO.31.002550, 1992. a
de Groot, P., Colonna de Lega, X., Kramer, J., and Turzhitsky, M.: Determination of fringe order in white-light interference microscopy, Appl. Opt., 41, 4571, https://doi.org/10.1364/AO.41.004571, 2002. a