Articles | Volume 4, issue 1
https://doi.org/10.5194/jsss-4-199-2015
https://doi.org/10.5194/jsss-4-199-2015
Regular research article
 | 
02 Jun 2015
Regular research article |  | 02 Jun 2015

Micro- and nanocoordinate measurements of micro-parts with 3-D tunnelling current probing

A. Schuler, T. Hausotte, and Z. Sun

Viewed

Total article views: 1,596 (including HTML, PDF, and XML)
HTML PDF XML Total BibTeX EndNote
885 578 133 1,596 130 134
  • HTML: 885
  • PDF: 578
  • XML: 133
  • Total: 1,596
  • BibTeX: 130
  • EndNote: 134
Views and downloads (calculated since 02 Jun 2015)
Cumulative views and downloads (calculated since 02 Jun 2015)

Cited

Latest update: 23 Nov 2024
Download
Short summary
Measurement tasks of modern micro- and nanometrology with decreasing structure sizes and rising aspect ratios require nanometre-resolving 3-D capable sensors. A 3-D probing system based on electrical interaction is presented which is operated on a nanopositioning system NMM-1. New 3-D measurement procedures for the probing system as well as for micrometrology measurement tasks in general are shown.