Regular research article
30 Oct 2019
Regular research article | 30 Oct 2019
Three-dimensional structural comparison of tantalum glancing angle deposition thin films by FIB-SEM
Tobias Ott et al.
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3 citations as recorded by crossref.
- Reconstructing porous structures from FIB-SEM image data: Optimizing sampling scheme and image processing D. Roldán et al. 10.1016/j.ultramic.2021.113291
- Applications of scanning electron microscopy and focused ion beam milling in dental research K. House et al. 10.1111/eos.12853
- Reconstruction of highly porous structures from FIB‐SEM using a deep neural network trained on synthetic images C. FEND et al. 10.1111/jmi.12944
Latest update: 28 Sep 2022