12 citations as recorded by crossref.

1. Thermorefringent noise in crystalline optical materials S. Kryhin et al. https://doi.org/10.1103/PhysRevD.107.022001
2. Modeling of CMOS Integrated Strain Sensors and Sensitivity Enhanced Readout Architecture K. Allinger et al. https://doi.org/10.1109/TCSI.2023.3339224
3. On the Impact of Mechanical Constraint on Band Structure and Photo‐Elastic Effect in Photonic Resonators J. Schlipf et al. https://doi.org/10.1002/apxr.70180
4. Thermally induced depolarization in a silicon (c-Si) single crystal I. Snetkov et al. https://doi.org/10.1364/OL.446337
5. Optical polarization perturbed by shear strains of ultrasonic bulk waves in anisotropic semiconductors: Multiphysics modeling and optoacoustic validation Y. He et al. https://doi.org/10.1016/j.pacs.2023.100540
6. Accuracy improvement of demodulating the stress field with StressUnet in photoelasticity W. Zhao et al. https://doi.org/10.1364/AO.464466
7. Effect of additional stress on birefringence of silicon-based optical waveguides with nitride-layer for arbitrary-orientated applications G. Wang et al. https://doi.org/10.1016/j.optcom.2026.133166
8. Stress-optical coefficients of copolymers T. Matseevich et al. https://doi.org/10.1051/e3sconf/202341001016
9. Study the opportunity of using Arduino controller for practical stress measurement induced in mechanical loaded members M. Hameed & M. Saleh https://doi.org/10.21595/jmeacs.2025.24618
10. Precision mapping of a silicon test mass birefringence V. Jaberian Hamedan et al. https://doi.org/10.1063/5.0136869
11. Quantitative shear stress imaging in high throughput in-line Si wafer inspection Z. Kovács et al. https://doi.org/10.1016/j.mssp.2024.108449
12. Whole-field principal angle and optical path retardation measurements using white light OPD scanning polariscope with first moment algorithm H. Le et al. https://doi.org/10.1016/j.measurement.2024.115409