9 citations as recorded by crossref.

1. Optical polarization perturbed by shear strains of ultrasonic bulk waves in anisotropic semiconductors: Multiphysics modeling and optoacoustic validation Y. He et al. 10.1016/j.pacs.2023.100540
2. Accuracy improvement of demodulating the stress field with StressUnet in photoelasticity W. Zhao et al. 10.1364/AO.464466
3. Thermorefringent noise in crystalline optical materials S. Kryhin et al. 10.1103/PhysRevD.107.022001
4. Modeling of CMOS Integrated Strain Sensors and Sensitivity Enhanced Readout Architecture K. Allinger et al. 10.1109/TCSI.2023.3339224
5. Stress-optical coefficients of copolymers T. Matseevich et al. 10.1051/e3sconf/202341001016
6. Thermally induced depolarization in a silicon (c-Si) single crystal I. Snetkov et al. 10.1364/OL.446337
7. Precision mapping of a silicon test mass birefringence V. Jaberian Hamedan et al. 10.1063/5.0136869
8. Quantitative shear stress imaging in high throughput in-line Si wafer inspection Z. Kovács et al. 10.1016/j.mssp.2024.108449
9. Whole-field principal angle and optical path retardation measurements using white light OPD scanning polariscope with first moment algorithm H. Le et al. 10.1016/j.measurement.2024.115409