Articles | Volume 3, issue 1
J. Sens. Sens. Syst., 3, 69–76, 2014

Special issue: 11th International Symposium on Measurement Technology and...

J. Sens. Sens. Syst., 3, 69–76, 2014

Regular research article 28 Mar 2014

Regular research article | 28 Mar 2014

A micro optical probe for edge contour evaluation of diamond cutting tools

S. H. Jang et al.

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Cited articles

Asai, S., Taguchi, Y., Horio, K., Kasai, T., and Kobayashi, A.: Measuring the very small cutting-edge radius for a diamond tool using a new kind of SEM having two detectors, CIRP Annals, 39, 85–88, 1990.
Brehm, R., van Dun, K., Teunissen, J. C. G., and Haisma, J.: Transparent single-point turning of optical glass, Precision Engineering, 1, 207–213, 1979.
Brinksmeier, E., Riemer, O., Gläbe, R., Lünemann, B., Kopylow, C. V., Dankwart, C., and Meier, A.: Submicron functional surfaces generated by diamond machining, CIRP Annals, 59, 535–538, 2010.
Chen, F. J., Yin, S. H., Huang, H., Ohmori, H., Wang, Y., Fan, Y. F., and Zhu, Y. J.: Profile error compensation in ultra-precision of aspheric surfaces with on-machine measurement, Int. J. Mach. Tool. Manu., 50, 480–486, 2010.
Drescher, J.: Scanning electron microscopic technique for imaging a diamond tool edge, Precision Engineering, 15, 112–114, 1993.