Articles | Volume 7, issue 2
https://doi.org/10.5194/jsss-7-517-2018
https://doi.org/10.5194/jsss-7-517-2018
Regular research article
 | 
28 Sep 2018
Regular research article |  | 28 Sep 2018

Modeling the unified measurement uncertainty of deflectometric and plenoptic 3-D sensors

Mathias Ziebarth, Niclas Zeller, Michael Heizmann, and Franz Quint

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Cited articles

Beyerer, J., Puente León, F., and Frese, C.: Automatische Sichtprüfung: Grundlagen, Methoden und Praxis der Bildgewinnung und Bildauswertung, Springer, Berlin Heidelberg, https://doi.org/10.1007/978-3-642-23966-3, 2012.
European Machine Vision Association: EMVA Standard 1288 – Standard for Characterization of Image Sensors and Cameras, Release 3.1, 30 December, 2016.
Fiete, R. D. and Paul, B. D.: Modeling the optical transfer function in the imaging chain, Opt. Eng., 53, 083103-1 – 083103-29, https://doi.org/10.1117/1.OE.53.8.083103, 2014.
Fischer, M., Petz, M., and Tutsch, R.: Vorhersage des Phasenrauschens in optischen Messsystemen mit strukturierter Beleuchtung, Tech. Mess., 79, 451–458, https://doi.org/10.1524/teme.2012.0256, 2012.
Harvey, J. E.: Parametric analysis of the effect of scattered light upon the modulation transfer function, Opt. Eng., 52, 073110–073110, https://doi.org/10.1117/1.OE.52.7.073110, 2013.
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Short summary
We propose a measurement uncertainty model of two complementary optical sensors: a deflectometric and a plenoptic sensor. The deflectometric sensor uses active triangulation and works best on specular surfaces, while the plenoptic sensor uses passive triangulation and works best on textured, diffusely reflecting surfaces. The predicted uncertainties can be used to obtain optimized measurements for varying surface properties. The models are validated exemplarily based on real measurements.