The paper presents a specimen and evaluation method for interface structural resolution testing of X-ray computed tomography systems based on CT simulations. The geometry is oriented to the norms of image quality investigation. The evaluation is based on profile lines of the cross-sectional images that pass through the boreholes. All statements on resolution refer to the entire measurement chain and, thus, in addition to the reconstruction algorithm also to the surface determination method used.

Acceptance and reverification testing for industrial CT systems is described in different standards. The characterisation and testing of CT system performance are often achieved with test artefacts containing spheres. This simulative study characterises the influence of different geometrical error sources – or geometrical misalignments – on these sphere measurements.

In order to contribute to a standardisation and process monitoring of additive manufacturing (AM) processes, a novel referencing approach was developed to improve the assessment of geometric manufacturing and measurement deviations. This is based on a referencing system integrated in the powder bed, which enables a shortening of the measuring loop. The position-stable quartz glass pipes enable more precise specification of lateral manufacturing and measurement deviations during AM.

The publication contributes to a uniform procedure for in-process measurement data acquisition in additive manufacturing, which is essential for a controlled correction of detected manufacturing deviations. The developed methodology is based on an analysis of the melt pool contours relative to a referencing system integrated in the powder bed. By recording the referenced melt pool and the shimmering contours after powder application, manufacturing deviations can be evaluated more accurately.

A new metrological atomic force microscope (MAFM) head design is shown. We investigated the MAFM head in the nanomeasuring machine (NMM-1) for different high-precision and large-scale traceable measurement tasks. Due to their integration, the MAFM head can benefit from the large measuring range, high-precision and traceability of the NMM-1 for efficient measurements on different samples. The presented results show the realised macroscale measurements with sub-nanometre resolution.